Methods, devices, and systems for reducing device test time

    公开(公告)号:US10699193B2

    公开(公告)日:2020-06-30

    申请号:US15833135

    申请日:2017-12-06

    Abstract: A method for testing and grading electronic devices includes receiving a set of testing data associated with an electronic device that is following a testing routine. Based on the set of testing data, the method includes computing a first performance metric of the electronic device by using a first artificial neural network and computing a second performance metric of the electronic device by using a second artificial neural network. Based on at least the first predicted performance metric and the second predicted performance metric, the method includes computing a grade for the electronic device.

    METHODS, DEVICES, AND SYSTEMS FOR REDUCING DEVICE TEST TIME

    公开(公告)号:US20190171940A1

    公开(公告)日:2019-06-06

    申请号:US15833135

    申请日:2017-12-06

    Abstract: A method for testing and grading electronic devices includes receiving a set of testing data associated with an electronic device that is following a testing routine. Based on the set of testing data, the method includes computing a first performance metric of the electronic device by using a first artificial neural network and computing a second performance metric of the electronic device by using a second artificial neural network. Based on at least the first predicted performance metric and the second predicted performance metric, the method includes computing a grade for the electronic device.

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