公开(公告)号：US20220381619A1

公开(公告)日：2022-12-01

申请号：US17875392

申请日：2022-07-27

申请人： Shanghai Institute of Optics And Fine Mechanics, Chinese Academy of Sciences

发明人： Xingchen PAN ,  Cheng LIU ,  Jianqiang ZHU

IPC分类号： G01J9/00 ,  G02B27/14 ,  G02B27/28 ,  G02B27/09 ,  G02B27/12 ,  G02B6/28 ,  H04N5/225 ,  H04N5/235

摘要： A device and method for phase imaging and element detection based on wavefront modulation are provided to overcome the disadvantages of an existing interferometry such as twin image elimination, limit resolution, under-sampling wavefront measurement, and multi-modal measurement. From the perspective of light field encoding, the accurate measurement to a complex amplitude of a light field to be measured is completely achieved by the iterative calculation, and at the same time, a twin image problem may be effectively eliminated, and it has the multi-modal (multi-wavelength) reconstruction ability. Theoretically, it is able to reach the diffraction limit resolution, may be widely used in phase imaging, optical element surface-type detection, polarization distribution measurement and the like, and it has a wide range of applications.