专利检索 ap:("Shaw Industries Group, Inc.") AND inv:"Philipe C.F. Aldahir" 第 1 页

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发明申请
SYSTEM AND METHOD FOR TESTING A SURFACE 有权

公开(公告)号：US20210102795A1

公开(公告)日：2021-04-08

申请号：US17020609

申请日：2020-09-14

申请人： Shaw Industries Group, Inc.

发明人： Philipe C.F. Aldahir , Jeremy Dutton , Austin Bruce Cole , Steven Sutton , Trevor Sands

IPC分类号： G01B5/28 , A63B71/02

摘要： Systems and methods for testing a surface are described. An apparatus can be configured to consistently strike a ball to maintain consistent testing conditions. One or more parameters may be determined based on a path of travel of the ball.