公开(公告)号：US09529069B2

公开(公告)日：2016-12-27

申请号：US14449748

申请日：2014-08-01

Applicant: Shenzhen Airdrawing Technology Service Co., Ltd

Inventor： Gui-Zhen Zhang ,  Quan-Long Yang ,  Hung-Jen Tseng

IPC: G01R35/00 ,  G01R31/12 ,  G01R31/00

CPC classification number: G01R35/00 ,  G01R31/001

Abstract: A test system for testing electrostatic testers, is used to test at least one electrostatic tester each including a voltage test terminal and a connection test terminal. The test system includes at least one optical coupler circuit and a chip. Each optical coupler circuit is coupled the voltage test terminal and the connection test terminal of one corresponding electrostatic tester, and each optical coupler circuit converts voltages of the voltage test terminal and the connection test terminal respectively to a voltage test signal and a connection test signal. The chip is couple to the at least one optical coupler circuit, and receives the connection test signal and the voltage test signal produced by the at least one optical coupler circuit, and determines whether the corresponding electrostatic tester connected to each optical coupler circuit is worked normally according to the connection test signal and the voltage test signal.

Abstract translation: 用于测试静电测试仪的测试系统用于测试至少一个静电测试仪，每个静电测试仪包括电压测试终端和连接测试终端。 测试系统包括至少一个光耦合器电路和芯片。 每个光耦合器电路与一个对应的静电测试仪的电压测试端子和连接测试端子耦合，并且每个光耦合器电路将电压测试端子和连接测试端子的电压分别转换成电压测试信号和连接测试信号。 所述芯片耦合到所述至少一个光耦合器电路，并且接收由至少一个光耦合器电路产生的连接测试信号和电压测试信号，并且确定连接到每个光耦合器电路的相应静电测试仪是否正常工作 根据连接测试信号和电压测试信号。