公开(公告)号：US20190013473A1

公开(公告)日：2019-01-10

申请号：US15577012

申请日：2017-08-17

Applicant: Shenzhen China Star Optoelectronics Technology Co., Ltd.

Inventor： Aiguo TU ,  CHUN-HSIUNG FANG ,  Tsung-yuan WU ,  Jinchuan LI ,  Liang JIANG ,  Feng WEI

IPC: H01L51/00 ,  G01N21/95 ,  G01N21/27

CPC classification number: H01L51/0031 ,  G01N21/27 ,  G01N21/95 ,  G01N2021/8845 ,  G01N2021/9513 ,  H01L51/56 ,  H01L2251/562

Abstract: An aging test system and method are disclosed. An aging test system includes a vacuum chamber provided with an aging device for aging a display panel; a lighting mechanism electrically connected to the display panel for lighting up the display panel; at least one spectrometer for detecting a color coordinate and a brightness of the display panel; at least one camera for detecting a dark spot defect of sub-pixels of the display panel. Accordingly, the present invention can save the inspection time, increase the inspection efficiency and save the inspection device in order to reduce the inspection cost.