STATE DETECTION CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE
    1.
    发明申请
    STATE DETECTION CIRCUIT AND SEMICONDUCTOR MEMORY DEVICE 审中-公开
    状态检测电路和半导体存储器件

    公开(公告)号:US20120002779A1

    公开(公告)日:2012-01-05

    申请号:US12846266

    申请日:2010-07-29

    IPC分类号: H03K21/00

    CPC分类号: H03K21/38

    摘要: A state detection circuit comprises: a first counter circuit that counts a series of first command signals indicative of start of an operation control; a second counter circuit that counts a series of second command signals indicative of completion of the operation control; a count coincidence detection circuit that detects coincidence between a count in the first counter circuit and a count in the second counter circuit; and a state storing circuit that is set by the series of first command signals and reset when coincidence is detected by the count coincidence detection circuit. The first and second counter circuits each comprise a binary counter.

    摘要翻译: 状态检测电路包括:第一计数器电路,对表示操作控制开始的一系列第一命令信号进行计数; 第二计数器电路,对表示操作控制完成的一系列第二命令信号进行计数; 计数一致检测电路,其检测第一计数电路的计数与第二计数电路的计数的一致性; 以及状态存储电路,其由所述一系列第一命令信号设定,并且在由所述计数一致检测电路检测到一致时复位。 第一和第二计数器电路各自包括二进制计数器。

    OPTICAL PICKUP DEVICE AND METHOD FOR MANUFACTURING THE SAME
    2.
    发明申请
    OPTICAL PICKUP DEVICE AND METHOD FOR MANUFACTURING THE SAME 失效
    光学拾取装置及其制造方法

    公开(公告)号:US20100162281A1

    公开(公告)日:2010-06-24

    申请号:US12624529

    申请日:2009-11-24

    IPC分类号: G11B7/00 B32B38/00

    CPC分类号: G11B7/22

    摘要: To provide an optical pickup device adapted such that for adhesion fixing of a holder for holding an LD or a light-receiving element to an optical pickup casing via an ultraviolet-curable adhesive, curing shrinkage during ultraviolet irradiation can be reduced and adhesion fixing achieved with high positioning accuracy. In a structure for adhesion fixing of a holder for holding an LD or a light-receiving element to an optical pickup casing via an ultraviolet-curable adhesive, since protrusions are provided at peripheral sections (UV irradiation light source side) on a bonding surface of the holder, a section exposed to strong UV light is first cured, then after the adhesive has moved from an uncured section, the amount of shrinkage of the first cured section in a Z-direction is reduced, and the uncured section is cured.

    摘要翻译: 为了提供一种光学拾取装置,适于使用于通过紫外线固化粘合剂将用于将LD或光接收元件保持在光拾取器壳体上的保持器的粘合固定,可以减少紫外线照射期间的固化收缩,并且可以降低粘合固定 定位精度高。 在用于通过紫外线固化型粘合剂将LD或光接收元件保持在光学拾取器壳体上的固定器的粘合固定结构中,由于在周边部分(UV照射光源侧)上的突出部分设置在 首先固化保持器,暴露于强紫外线的部分,然后在粘合剂从未固化部分移动之后,Z方向上的第一固化部分的收缩量减少,并且未固化部分固化。

    SEMICONDUCTOR DEVICE HAVING TEST MODE AND METHOD OF CONTROLLING THE SAME
    3.
    发明申请
    SEMICONDUCTOR DEVICE HAVING TEST MODE AND METHOD OF CONTROLLING THE SAME 失效
    具有测试模式的半导体器件及其控制方法

    公开(公告)号:US20120131397A1

    公开(公告)日:2012-05-24

    申请号:US13292834

    申请日:2011-11-09

    申请人: Hiroyasu YOSHIDA

    发明人: Hiroyasu YOSHIDA

    IPC分类号: G11C29/10 G06F11/26

    CPC分类号: G11C29/028 G11C29/16

    摘要: When an update disable signal is at an inactivation level, a latch signal is activated in accordance with an active signal and a mode register set signal. When the update disable signal is at an activation level, the latch signal is activated in accordance with the active signal while being not activated in accordance with the mode register set signal. Based on the latch signal, the address signal is latched. Based on the latched address signal, an internal test signal is generated. With this structure, a target chip can be selectively controlled simply by activating the update disable signal in the target chip.

    摘要翻译: 当更新禁止信号处于非激活级时,根据活动信号和模式寄存器设置信号激活锁存信号。 当更新禁止信号处于激活电平时,锁存信号根据有效信号被激活,同时根据模式寄存器设置信号不被激活。 基于锁存信号,地址信号被锁存。 基于锁存的地址信号,产生内部测试信号。 利用这种结构,可以通过激活目标芯片中的更新禁止信号来简单地选择性地控制目标芯片。