Method for plasma etching of positively sloped structures
    1.
    发明授权
    Method for plasma etching of positively sloped structures 有权
    正倾斜结构的等离子体蚀刻方法

    公开(公告)号:US07829465B2

    公开(公告)日:2010-11-09

    申请号:US11834127

    申请日:2007-08-06

    IPC分类号: H01L21/301 H01L21/461

    摘要: The present invention provides a method of etching features in a substrate. The method comprising the steps of placing the substrate on a substrate support in a vacuum chamber. An alternatingly and repeating process is performed on the substrate until a predetermined trench depth and a predetermined sidewall angle are achieved. One part of the process is a deposition step which is carried out by introducing at least one polymer containing gas into the vacuum chamber. A plasma is ignited from the polymer containing gas which is then used to deposit a polymer on the substrate. The other part of the alternatingly and repeating process is an etching step which is carried out by introducing an etchant containing gas, a polymer containing gas and a scavenger containing gas into the vacuum chamber. A plasma is ignited from the etchant containing gas, the polymer containing gas and the scavenger containing gas which is then used to etch the substrate.

    摘要翻译: 本发明提供一种蚀刻衬底中的特征的方法。 该方法包括以下步骤:将基板放置在真空室中的基板支撑件上。 在基板上进行交替重复的处理,直到实现预定的沟槽深度和预定的侧壁角。 该方法的一部分是沉积步骤,其通过将至少一种含聚合物的气体引入真空室来进行。 等离子体从含聚合物的气体点燃,然后将其用于在基底上沉积聚合物。 交替重复工艺的另一部分是蚀刻步骤,其通过将含蚀刻剂的气体,含有气体的聚合物和含有气体的清除剂引入真空室来进行。 等离子体从含蚀刻剂的气体中点燃,含聚合物的气体和含有清除剂的气体,然后用于蚀刻衬底。

    Method for Plasma Etching of Positively Sloped Structures
    2.
    发明申请
    Method for Plasma Etching of Positively Sloped Structures 有权
    积极斜坡结构等离子体蚀刻方法

    公开(公告)号:US20080061029A1

    公开(公告)日:2008-03-13

    申请号:US11834127

    申请日:2007-08-06

    IPC分类号: B44C1/22

    摘要: The present invention provides a method of etching features in a substrate. The method comprising the steps of placing the substrate on a substrate support in a vacuum chamber. An alternatingly and repeating process is performed on the substrate until a predetermined trench depth and a predetermined sidewall angle are achieved. One part of the process is a deposition step which is carried out by introducing at least one polymer containing gas into the vacuum chamber. A plasma is ignited from the polymer containing gas which is then used to deposit a polymer on the substrate. The other part of the alternatingly and repeating process is an etching step which is carried out by introducing an etchant containing gas, a polymer containing gas and a scavenger containing gas into the vacuum chamber. A plasma is ignited from the etchant containing gas, the polymer containing gas and the scavenger containing gas which is then used to etch the substrate.

    摘要翻译: 本发明提供一种蚀刻衬底中的特征的方法。 该方法包括以下步骤:将基板放置在真空室中的基板支撑件上。 在基板上进行交替重复的处理,直到实现预定的沟槽深度和预定的侧壁角。 该方法的一部分是沉积步骤,其通过将至少一种含聚合物的气体引入真空室来进行。 等离子体从含聚合物的气体点燃,然后将其用于在基底上沉积聚合物。 交替重复工艺的另一部分是蚀刻步骤,其通过将含蚀刻剂的气体,含有气体的聚合物和含有气体的清除剂引入真空室来进行。 等离子体从含蚀刻剂的气体中点燃,含聚合物的气体和含有清除剂的气体,然后用于蚀刻衬底。