摘要:
A liquid crystal display (LCD) inspection apparatus and method are provided. The inspection apparatus and method are capable of automatically and accurately detecting defects of an LCD panel, and providing information of the automatically-detected defects of the LCD panel to the operator, thereby enabling the operator to easily recognize the defects.
摘要:
An LCD test method and apparatus for reducing the number of channels of a probe unit is provided. An apparatus for testing a liquid crystal display including: a stage on which a liquid crystal panel is placed; a plurality of vertically divided blocks, wherein each of the vertically divided blocks include a plurality of adjacent data lines; a data probe unit that provides test pattern signals respectively to groups of at least two of the plurality of vertically divided blocks of the liquid crystal panel; a plurality of horizontally divided blocks, wherein each of the horizontally divided blocks include a plurality of adjacent gate lines; a gate probe unit that provides scanning signals respectively to the plurality of horizontally divided blocks of the liquid crystal panel; and a controller that provides test pattern signals to the data probe unit and provides scanning signals to the gate probe unit.
摘要:
The liquid crystal display (LCD) inspection apparatus for inspecting an LCD panel includes a worktable which supports the LCD panel to be seated on a front side of the worktable, probe units which are electrically connected to the LCD panel, a backlight unit which supplies light to the LCD panel, an imaging unit which photographs an image of the LCD panel supported by the worktable, a first polarizing plate which is arranged between the imaging unit and the LCD panel to polarize the light, a second polarizing plate which is arranged between the LCD panel and the backlight unit to polarize the light, an illumination unit which emits illumination light to surfaces of the LCD panel, and an image processor which receives the image photographed by the imaging unit, and extracts defect information from the received image.
摘要:
A liquid crystal display (LCD) inspection apparatus for inspecting an LCD panel, includes a worktable to support an LCD panel seated on a front side of the worktable, probe units to be electrically connected to the LCD panel, a backlight unit to emit light toward the LCD panel, a first polarizing plate arranged in front of the LCD panel to polarize the light, and a second polarizing plate arranged between the LCD panel and the backlight unit to polarize the light, and a shutter unit to selectively shut off the light emitted from the backlight unit toward the LCD panel.
摘要:
A thin film transistor array substrate comprises thin film transistors and pixel electrodes formed at respective pixels that are defined by gate lines and data lines that orthogonally intersect each other. The thin film transistor array substrate further comprises a plurality of gate pad units that group a plurality of gate pads extended from the gate lines, and a plurality of data pad units that groups a plurality of data pads extended from the data lines. The thin film transistor array substrate further includes a plurality of gate test terminals connected to the gate pad units and beside at least one side of the respective gate pad units, and a plurality of data test terminals connected to the data pad units and located beside at least one side of the respective data pad units.
摘要:
An LCD test method and apparatus for reducing the number of channels of a probe unit is provided. An apparatus for testing a liquid crystal display including: a stage on which a liquid crystal panel is placed; a plurality of vertically divided blocks, wherein each of the vertically divided blocks include a plurality of adjacent data lines; a data probe unit that provides test pattern signals respectively to groups of at least two of the plurality of vertically divided blocks of the liquid crystal panel; a plurality of horizontally divided blocks, wherein each of the horizontally divided blocks include a plurality of adjacent gate lines; a gate probe unit that provides scanning signals respectively to the plurality of horizontally divided blocks of the liquid crystal panel; and a controller that provides test pattern signals to the data probe unit and provides scanning signals to the gate probe unit.
摘要:
A thin film transistor array substrate comprises thin film transistors and pixel electrodes formed at respective pixels that are defined by gate lines and data lines that orthogonally intersect each other. The thin film transistor array substrate further comprises a plurality of gate pad units that group a plurality of gate pads extended from the gate lines, and a plurality of data pad units that groups a plurality of data pads extended from the data lines. The thin film transistor array substrate further includes a plurality of gate test terminals connected to the gate pad units and beside at least one side of the respective gate pad units, and a plurality of data test terminals connected to the data pad units and located beside at least one side of the respective data pad units.
摘要:
A liquid crystal display (LCD) inspection apparatus and method are provided. The inspection apparatus and method are capable of automatically and accurately detecting defects of an LCD panel, and providing information of the automatically-detected defects of the LCD panel to the operator, thereby enabling the operator to easily recognize the defects.
摘要:
An LCD test method and apparatus for reducing the number of channels of a probe unit is provided. An apparatus for testing a liquid crystal display including: a stage on which a liquid crystal panel is placed; a plurality of vertically divided blocks, wherein each of the vertically divided blocks include a plurality of adjacent data lines; a data probe unit that provides test pattern signals respectively to groups of at least two of the plurality of vertically divided blocks of the liquid crystal panel; a plurality of horizontally divided blocks, wherein each of the horizontally divided blocks include a plurality of adjacent gate lines; a gate probe unit that provides scanning signals respectively to the plurality of horizontally divided blocks of the liquid crystal panel; and a controller that provides test pattern signals to the data probe unit and provides scanning signals to the gate probe unit.
摘要:
A liquid crystal display (LCD) inspection apparatus is provided which is capable of preventing detection of defects from being omitted or degraded due to formation of stains in a certain region of an LCD panel in an inspection of the LCD panel.