Method and evaluation device for determining the position of a structure located in an object to be examined by means of X-ray computer tomography
    1.
    发明授权
    Method and evaluation device for determining the position of a structure located in an object to be examined by means of X-ray computer tomography 有权
    用于通过X射线计算机断层摄影来确定位于待检查物体中的结构的位置的方法和评估装置

    公开(公告)号:US08897534B2

    公开(公告)日:2014-11-25

    申请号:US13882817

    申请日:2011-10-31

    IPC分类号: G06K9/00 G06T7/00

    摘要: In a method and an evaluation device for determining the position of a structure located in an object to be investigated by means of X-ray computer tomography, a cutting data record, which images the object in a cutting plane, is determined from a volume data record of the object. The cutting data record is binarized to form a binary data record, in which the structure voxels imaging the structure and the surface voxels imaging an object surface are determined. To determine the position, a distance data record is produced in such a way that a distance value, which characterizes the smallest distance of the respective distance voxel from the surface voxels, is assigned to each distance voxel of the distance data record. The distance voxels corresponding to the structure voxels are then determined and the associated distance values evaluated.

    摘要翻译: 在通过X射线计算机断层摄影确定位于待研究对象中的结构的位置的方法和评估装置中,根据卷数据确定在切割平面中对物体进行成像的切割数据记录 对象的记录。 切割数据记录被二值化以形成二进制数据记录,其中结构体素对结构进行成像和对物体表面成像的表面体素进行确定。 为了确定位置,产生距离数据记录,使得将距离体素与表面体素的最小距离表征的距离值分配给距离数据记录的每个距离体素。 然后确定与结构体素相对应的距离体素,并评估相关联的距离值。