公开(公告)号：US20240186358A1

公开(公告)日：2024-06-06

申请号：US17796654

申请日：2022-07-29

申请人： Suzhou China Star Optoelectronics Technology Co., Ltd.

发明人： Hao WU ,  Wenbing ZHANG ,  Feng GAO ,  Zhenhua RAO ,  Yufei XIA

IPC分类号： H01L27/146 ,  H01L25/16 ,  H04N17/00

CPC分类号： H01L27/14643 ,  H01L25/167 ,  H01L27/14623 ,  H01L27/14627 ,  H01L27/14636 ,  H04N17/002

摘要： The present invention relates to a CMOS image chip, a camera, thereof, and a debugging method thereof. The CMOS image chip of the present invention disposes light emitting diodes in a light emitting region and uses a projection pattern of the light emitting diodes on a substrate to be inspected to determine a photosensitive effective region of the CMOS image chip on the underlay to prevent the issue that the conventional technology uses an image by camera imaging on a display device as debug basis and a camera imaging image has signal delay to result in a low debugging efficiency, which drastically improves a debugging efficiency of the camera.