公开(公告)号：US20220078900A1

公开(公告)日：2022-03-10

申请号：US17400979

申请日：2021-08-12

申请人： TAE TECHNOLOGIES, INC.

发明人： Vladislav Vekselman ,  Suu Duong ,  Alexander Dunaevsky ,  Igor Nikolaevich Sorokin

IPC分类号： H05H9/02

摘要： Embodiments of systems, devices, and methods relate to initiating beam transport for an accelerator system. An example method includes increasing a bias voltage of one or more electrodes of the accelerator system to a first voltage level and extracting a charged particle beam from a beam source such that the beam is transported through the accelerator system. The beam has a beam current that results in a first transient voltage drop within a threshold. The method further includes increasing the beam current at a rate that results in one or more subsequent transient voltage drops within the threshold until the accelerator system has reached nominal conditions. Another example method includes biasing one or more electrodes of an accelerator system and selectively extracting, according to a duty cycle function, a charged particle beam from a beam source such that the charged particle beam is transported through the accelerator system.

公开(公告)号：US12010788B2

公开(公告)日：2024-06-11

申请号：US17400979

申请日：2021-08-12

申请人： TAE TECHNOLOGIES, INC.

发明人： Vladislav Vekselman ,  Suu Duong ,  Alexander Dunaevsky ,  Igor Nikolaevich Sorokin

IPC分类号： H05H9/04 ,  H05H9/02 ,  H05H13/00 ,  H05H13/10 ,  H05H7/22

CPC分类号： H05H9/02 ,  H05H2007/225 ,  H05H2007/227

摘要： Embodiments of systems, devices, and methods relate to initiating beam transport for an accelerator system. An example method includes increasing a bias voltage of one or more electrodes of the accelerator system to a first voltage level and extracting a charged particle beam from a beam source such that the beam is transported through the accelerator system. The beam has a beam current that results in a first transient voltage drop within a threshold. The method further includes increasing the beam current at a rate that results in one or more subsequent transient voltage drops within the threshold until the accelerator system has reached nominal conditions. Another example method includes biasing one or more electrodes of an accelerator system and selectively extracting, according to a duty cycle function, a charged particle beam from a beam source such that the charged particle beam is transported through the accelerator system.