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公开(公告)号:US20210320074A1
公开(公告)日:2021-10-14
申请号:US17356302
申请日:2021-06-23
发明人: Rafael Jose Lizares Guevara , Aniceto Tabangcura Rabilas, JR. , Ray Fredric Solis de Asis , Sylvester Tigno Sanchez , Alvin Lopez Andaya
IPC分类号: H01L23/00 , H01L21/56 , H01L23/495
摘要: In some examples, a package comprises a semiconductor die and a bond pad formed upon the semiconductor die. The bond pad has a protrusion on a top surface of the bond pad. The package also comprises a metal contact and a bond wire coupled to the protrusion and to the metal contact.
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公开(公告)号:US11600583B2
公开(公告)日:2023-03-07
申请号:US17356302
申请日:2021-06-23
发明人: Rafael Jose Lizares Guevara , Aniceto Tabangcura Rabilas, Jr. , Ray Fredric Solis de Asis , Sylvester Tigno Sanchez , Alvin Lopez Andaya
IPC分类号: H01L23/00 , H01L21/56 , H01L23/495
摘要: In some examples, a package comprises a semiconductor die and a bond pad formed upon the semiconductor die. The bond pad has a protrusion on a top surface of the bond pad. The package also comprises a metal contact and a bond wire coupled to the protrusion and to the metal contact.
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公开(公告)号:US11081456B2
公开(公告)日:2021-08-03
申请号:US16554025
申请日:2019-08-28
发明人: Rafael Jose Lizares Guevara , Aniceto Tabangcura Rabilas, Jr. , Ray Fredric Solis de Asis , Sylvester Tigno Sanchez , Alvin Lopez Andaya
IPC分类号: H01L23/00 , H01L21/56 , H01L23/495
摘要: In some examples, a package comprises a semiconductor die and a bond pad formed upon the semiconductor die. The bond pad has a protrusion on a top surface of the bond pad. The package also comprises a metal contact and a bond wire coupled to the protrusion and to the metal contact.
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