专利检索 ap:("TEXAS INSTRUMENTS INCORPORATED") AND inv:"Rubin A, Parekhji" 第 1 页

1.

发明公开
COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROCESSES, CIRCUITS, DEVICES AND SYSTEMS 审中-公开

公开(公告)号：US20230194605A1

公开(公告)日：2023-06-22

申请号：US18113688

申请日：2023-02-24

申请人： TEXAS INSTRUMENTS INCORPORATED

发明人： Prakash Narayanan , Rubin A, Parekhji , Arvind Jain , Sundarrajan Subramanian

IPC分类号： G01R31/3177 , G01R31/3185

CPC分类号： G01R31/3177 , G01R31/318547 , G01R31/318536

摘要： Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.

2.

发明申请
COMPRESSED SCAN CHAIN DIAGNOSIS BY INTERNAL CHAIN OBSERVATION, PROCESSES, CIRCUITS, DEVICES AND SYSTEMS 有权

公开(公告)号：US20210364569A1

公开(公告)日：2021-11-25

申请号：US17396079

申请日：2021-08-06

申请人： TEXAS INSTRUMENTS INCORPORATED

发明人： Prakash Narayanan , Rubin A, Parekhji , Arvind Jain , Sundarrajan Subramanian

IPC分类号： G01R31/3177 , G01R31/3185

摘要： Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.