公开(公告)号：US11592483B2

公开(公告)日：2023-02-28

申请号：US17396079

申请日：2021-08-06

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Prakash Narayanan ,  Rubin A Parekhji ,  Arvind Jain ,  Sundarrajan Subramanian

IPC: G01R31/00 ,  G01R31/3177 ,  G01R31/3185

Abstract: Electronic scan circuitry includes a decompressor (510), a plurality of scan chains (520.i) fed by the decompressor (510), a scan circuit (502, 504) coupled to the plurality of scan chains (520.i) to scan them in and out, a masking circuit (590) fed by the scan chains (520.i), and a scannable masking qualification circuit (550, 560, 580) coupled to the masking circuit (590), the masking qualification circuit (550, 560, 580) scannable by scan-in of bits by the decompressor (510) along with scan-in of the scan chains (520.i), and the scannable masking qualification circuit (550, 560, 580) operable to hold such scanned-in bits upon scan-out of the scan chains through the masking circuit (590). Other scan circuitry, processes, circuits, devices and systems are also disclosed.