公开(公告)号：US20220163590A1

公开(公告)日：2022-05-26

申请号：US17532970

申请日：2021-11-22

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Charles Kasimer SESTOK, IV ,  David Patrick MAGEE ,  Yevgen Pavlovich BARSUKOV

IPC: G01R31/367 ,  G01R31/3842 ,  G01R31/389

Abstract: A circuit for determining device under test (DUT) model parameters is described. The circuit includes a parameter estimator circuit configured to: obtain initial values for DUT model parameters based on sense signal samples; execute a parameter convergence model having a regularization parameter and a cost function that accounts for error residuals; and obtain final values for the DUT model parameters by adjusting the regularization parameter in iterations of the parameter convergence model as a function of cost function improvement until the parameter convergence model converges to within a target tolerance.