公开(公告)号：US20250069208A1

公开(公告)日：2025-02-27

申请号：US18784134

申请日：2024-07-25

Applicant: THE BOARD OF REGENTS OF THE UNIVERSITY OF TEXAS SYSTEM

Inventor： Zbyszek Otwinowski ,  Raquel Bromberg ,  Dominika Borek

IPC: G06T5/80 ,  H01J37/22

Abstract: Methods for correcting one or more image aberrations in an electron microscopy image, including cryo-EM images, are provided. The method includes obtaining a plurality of electron microscope (EM) images of an internal reference grid sample having one or more known properties, the plurality of electron microscope images obtained for a plurality of optical conditions and for a plurality of coordinated beam-image shifts. The method may also include, among other features, determining an aberration correction function that predicts aberrations for every point in the imaged area using kernel canonical correlation analysis (KCCA).

公开(公告)号：US12073541B2

公开(公告)日：2024-08-27

申请号：US17633133

申请日：2020-08-10

Applicant: THE BOARD OF REGENTS OF THE UNIVERSITY OF TEXAS SYSTEM

Inventor： Zbyszek Otwinowski ,  Raquel Bromberg ,  Dominika Borek

IPC: G06T5/80 ,  H01J37/22

CPC classification number: G06T5/80 ,  H01J37/222 ,  G06T2207/10061 ,  H01J2237/223 ,  H01J2237/2826

Abstract: Methods for correcting one or more image aberrations in an electron microscopy image, including cryo-EM images, are provided. The method includes obtaining a plurality of electron microscope (EM) images of an internal reference grid sample having one or more known properties, the plurality of electron microscope images obtained for a plurality of optical conditions and for a plurality of coordinated beam-image shifts. The method may also include, among other features, determining an aberration correction function that predicts aberrations for every point in the imaged area using kernel canonical correlation analysis (KCCA).

公开(公告)号：US20220277427A1

公开(公告)日：2022-09-01

申请号：US17633133

申请日：2020-08-10

Applicant: THE BOARD OF REGENTS OF THE UNIVERSITY OF TEXAS SYSTEM

Inventor： Raquel Bromberg ,  Zbyszek Otwinowski ,  Dominika Borek

IPC: G06T5/00 ,  H01J37/22

Abstract: Methods for correcting one or more image aberrations in an electron microscopy image, including cryo-EM images, are provided. The method includes obtaining a plurality of electron microscope (EM) images of an internal reference grid sample having one or more known properties, the plurality of electron microscope images obtained for a plurality of optical conditions and for a plurality of coordinated beam-image shifts. The method may also include, among other features, determining an aberration correction function that predicts aberrations for every point in the imaged area using kernel canonical correlation analysis (KCCA).