公开(公告)号：US20180130233A1

公开(公告)日：2018-05-10

申请号：US15806076

申请日：2017-11-07

Applicant: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC

Inventor： Francis J. DECK ,  Carla S. DRAPER ,  Alan RONEMUS ,  William Robert KEEFE

IPC: G06T7/80 ,  G01J3/28 ,  G01J3/02 ,  G02B21/34 ,  H04N17/00

CPC classification number: G06T7/80 ,  G01J3/0275 ,  G01J3/2823 ,  G02B21/34 ,  G02B21/365 ,  G06T7/20 ,  G06T2207/10056 ,  H04N17/002

Abstract: An embodiment of a calibration element for an analytical microscope is described that comprises a substantially non-periodic pattern of features that exhibit contrast when illuminated by a light beam.