SYSTEM AND METHOD FOR SPECTROSCOPIC DETERMINATION OF INTENSITY LEVEL AND SIGNAL-TO-NOISE RATIO FROM SAMPLE SCANS

    公开(公告)号:US20240393179A1

    公开(公告)日:2024-11-28

    申请号:US18674335

    申请日:2024-05-24

    Abstract: Methods and systems for predicting signal quality. One analytical instrument support system receives preliminary sample data collected from a short scan of a sample. The analytical instrument support system determines a bright-max intensity level based on preliminary sample data. The analytical instrument support system determines a performance class based on, at least, the bright-max intensity level. The analytical instrument support system determines an intensity-to-time model, the intensity-to-time model includes a plurality of intensity to levels and a plurality of exposure times based on, at least, one or more deviations from an intensity linear model, the one or more deviations associated with the determined performance class. The analytical instrument support apparatus determines a first maximum intensity level based on, at least, a first corresponding exposure time and the intensity-to-time model, or a first parameter exposure time based on, at least, a first corresponding intensity level and the intensity-to-time model.

Patent Agency Ranking