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公开(公告)号:US20240393179A1
公开(公告)日:2024-11-28
申请号:US18674335
申请日:2024-05-24
Inventor: Rafet MALTAS , Lin ZHANG
Abstract: Methods and systems for predicting signal quality. One analytical instrument support system receives preliminary sample data collected from a short scan of a sample. The analytical instrument support system determines a bright-max intensity level based on preliminary sample data. The analytical instrument support system determines a performance class based on, at least, the bright-max intensity level. The analytical instrument support system determines an intensity-to-time model, the intensity-to-time model includes a plurality of intensity to levels and a plurality of exposure times based on, at least, one or more deviations from an intensity linear model, the one or more deviations associated with the determined performance class. The analytical instrument support apparatus determines a first maximum intensity level based on, at least, a first corresponding exposure time and the intensity-to-time model, or a first parameter exposure time based on, at least, a first corresponding intensity level and the intensity-to-time model.