公开(公告)号：US20160153899A1

公开(公告)日：2016-06-02

申请号：US14904634

申请日：2014-07-10

Applicant: TOPNIR SYSTEMS SAS

Inventor： Didier Lambert ,  Claude Saint Martin ,  Sanchez Miguel ,  Bernard Ribeiro

IPC: G01N21/359 ,  G01N21/27

CPC classification number: G01N21/359 ,  G01N21/274 ,  G01N21/35 ,  G01N2201/127

Abstract: The present invention relates to a method for characterizing a sample-product X by spectral analysis by means of a novel spectrometer II using information acquired by means of a first spectrometer I.

Abstract translation: 本发明涉及通过使用通过第一光谱仪I获得的信息的新型光谱仪II的光谱分析来表征样品X的方法。