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公开(公告)号:US20210325685A1
公开(公告)日:2021-10-21
申请号:US16872692
申请日:2020-05-12
Applicant: TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
Inventor: JIA-LIANG WU , YI-YIN CHEN
Abstract: An optical integration device includes a first circuit layer comprising a first surface adjacent a first diffractive layer, the first diffractive layer arranged on a side of the first circuit layer along a first direction, and a first connecting pad electrically connected with the first circuit layer through a first conductive member. The optical integration device includes a side surface extending along the first direction. The side surface defines a first concavity extending through the first diffractive layer along the first direction. The first connecting pad includes a first mounting member connected with the side surface, and a first convex member extending from the first mounting member and received in the first concavity. The first conductive member includes a first conductive part arranged between the side surface and the first mounting member, and a second conductive part arranged between the first surface and the first convex member.
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公开(公告)号:US20230063898A1
公开(公告)日:2023-03-02
申请号:US17854208
申请日:2022-06-30
Applicant: TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
Inventor: JIA-LIANG WU
IPC: G06F11/22
Abstract: A method for testing electronic products implemented in an electronic device includes selecting a serial port connected with a slave device in serial communication with a product under test. An activation instruction is transmitted to the slave device, and the electronic product is started through the slave device. Data stored in at least one register of the electronic product and a state of the electronic product is obtained and a capacitance of at least one capacitor in the electronic product is measured. When the electronic product is found to be in an abnormal state, determining a cause of abnormality according to data of the electronic product and the capacitance of the at least one capacitor.
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