公开(公告)号：US12188970B2

公开(公告)日：2025-01-07

申请号：US17475245

申请日：2021-09-14

Applicant: TRON FUTURE TECH INC.

Inventor： Yu-Jiu Wang ,  Li Han Chang

IPC: G01R29/10 ,  H01Q3/26 ,  H04B17/00 ,  H04B17/10 ,  H04B17/12

Abstract: A near-field testing apparatus for testing a device under test having an array of transmitter antennas is provided. The near-field testing apparatus includes a frame structure and a receiver circuit. The frame structure defines an array of grid sections, and is arranged for receiving the array of transmitter antennas at a first side of the array of grid sections. A periphery of each grid section at the first side surrounds a plurality of transmitter antennas in the array of transmitter antennas. The grid section is arranged to guide respective electromagnetic signals emitted by the transmitter antennas from the first side to a second side of the array of grid sections. The receiver circuit, disposed at the second side of the array of grid sections, is arranged to couple the electromagnetic signals out of the grid section.