公开(公告)号：US20080018338A1

公开(公告)日：2008-01-24

申请号：US11826145

申请日：2007-07-12

申请人： Tak Eun ,  Seong Jin Kim ,  Hee Dok Choi ,  Dong Jun Lee ,  Dae Woong Song

发明人： Tak Eun ,  Seong Jin Kim ,  Hee Dok Choi ,  Dong Jun Lee ,  Dae Woong Song

IPC分类号： G01R31/14 ,  G01R27/26

CPC分类号： G01R31/024 ,  G01R1/06788

摘要： Disclosed herein are an apparatus and method for testing open and short circuits of conductive lines. A probe is brought into contact with one end of each of the conductive lines, AC power is applied, and the conductive lines are tested using electrical variations measured in the probe. By using a single-side probe device, it is possible to remarkably reduce the number of probes when the open or short circuit of a PCB pattern, a data transmission line or an electrical cable is tested and to remarkably reduce time or labor necessary for testing the open or short circuit. Since the measurement is performed only at one end of the conductive line to test the open or short circuit of the conductive line, it is possible to self-diagnose the open or short circuit when a single-side probe device is mounted in an input/output port of an electrical device.

摘要翻译： 本文公开了一种用于测试导线的开路和短路的装置和方法。 使探针与每个导线的一端接触，施加AC电力，并且使用在探针中测量的电变化来测试导线。 通过使用单面探针装置，可以显着减少PCB图案，数据传输线或电缆的开路或短路测试时的探头数量，并显着减少测试所需的时间或劳动 开路或短路。 由于仅在导线的一端进行测量以测试导线的开路或短路，所以当单侧探针装置安装在输入/输出端口中时，可以自我诊断开路或短路， 电气设备的输出端口。

公开(公告)号：US07629796B2

公开(公告)日：2009-12-08

申请号：US11826145

申请日：2007-07-12

申请人： Tak Eun ,  Seong Jin Kim ,  Hee Dok Choi ,  Dong Jun Lee ,  Dae Woong Song

发明人： Tak Eun ,  Seong Jin Kim ,  Hee Dok Choi ,  Dong Jun Lee ,  Dae Woong Song

IPC分类号： G01R15/12

CPC分类号： G01R31/024 ,  G01R1/06788

摘要： Disclosed herein are an apparatus and method for testing open and short circuits of conductive lines. A probe is brought into contact with one end of each of the conductive lines, AC power is applied, and the conductive lines are tested using electrical variations measured in the probe. By using a single-side probe device, it is possible to remarkably reduce the number of probes when the open or short circuit of a PCB pattern, a data transmission line or an electrical cable is tested and to remarkably reduce time or labor necessary for testing the open or short circuit. Since the measurement is performed only at one end of the conductive line to test the open or short circuit of the conductive line, it is possible to self-diagnose the open or short circuit when a single-side probe device is mounted in an input/output port of an electrical device.

摘要翻译： 本文公开了一种用于测试导线的开路和短路的装置和方法。 使探针与每个导线的一端接触，施加AC电力，并且使用在探针中测量的电变化来测试导线。 通过使用单面探针装置，可以显着减少PCB图案，数据传输线或电缆的开路或短路测试时的探针数量，并显着减少测试所需的时间或劳动 开路或短路。 由于仅在导线的一端进行测量以测试导线的开路或短路，所以当单侧探针装置安装在输入/输出端口中时，可以自我诊断开路或短路， 电气设备的输出端口。