公开(公告)号：US08803516B2

公开(公告)日：2014-08-12

申请号：US13140845

申请日：2009-12-14

申请人： Takashi Hibino ,  Takashi Fujimoto ,  Keisuke Komatsu ,  Yoshiyuki Nakao ,  Makoto Takata ,  Makoto Sakamoto

发明人： Takashi Hibino ,  Takashi Fujimoto ,  Keisuke Komatsu ,  Yoshiyuki Nakao ,  Makoto Takata ,  Makoto Sakamoto

IPC分类号： G01R33/12 ,  G01N27/90 ,  G01N27/82

CPC分类号： G01N27/902 ,  G01N27/82

摘要： In an eddy current testing method which involves using a rotatable eddy current testing probe in which a detection coil is arranged within an exciting coil, a change in detection sensitivity (a deviation of detection sensitivity) which changes depending on the rotational position of the detection coil is reduced. The eddy current testing probe includes an exciting coil EC1, a detection coil DC1, an exciting coil EC2 and a detection coil DC2, which are mounted on a disk DS. The eddy current testing probe is placed so as to face a circumferential surface of an object to be inspected T, which is in the shape of a circular cylinder, and the disk DS is rotated. Then, the distance (liftoff) between the detection coils DC1 and DC2 and an inspection surface changes. Therefore, also the detection sensitivity to a flaw signal changes. To reduce the change in detection sensitivity, the detection sensitivity is adjusted by detecting the rotational position (rotational angle) of the detection coils DC1 and DC2.

摘要翻译： 在涡电流测试方法中，涉及使用其中检测线圈布置在励磁线圈内的可旋转涡流测试探针，检测灵敏度的变化（检测灵敏度的偏差）根据检测线圈的旋转位置而变化 降低了。 涡电流测试探头包括安装在盘DS上的励磁线圈EC1，检测线圈DC1，励磁线圈EC2和检测线圈DC2。 将涡电流测试探针放置成面对被检查物体T的圆周表面，该圆形表面呈圆柱形，圆盘DS旋转。 然后，检测线圈DC1和DC2之间的距离（剥离）和检查面发生变化。 因此，对缺陷信号的检测灵敏度也会发生变化。 为了减小检测灵敏度的变化，通过检测检测线圈DC1和DC2的旋转位置（旋转角度）来调节检测灵敏度。

公开(公告)号：US20120092005A1

公开(公告)日：2012-04-19

申请号：US13286429

申请日：2011-11-01

申请人： Takashi HIBINO ,  Takashi Fujimoto ,  Shigeki Namekata ,  Keisuke Komatsu ,  Yoshiyuki Nakao ,  Makoto Takata ,  Makoto Sakamoto

发明人： Takashi HIBINO ,  Takashi Fujimoto ,  Shigeki Namekata ,  Keisuke Komatsu ,  Yoshiyuki Nakao ,  Makoto Takata ,  Makoto Sakamoto

IPC分类号： G01N27/90

CPC分类号： G01N27/902 ,  G01N27/904

摘要： A rotary eddy current flaw detection probe device has a plurality of Θ-shaped eddy current flaw detection probes attached in a rotating disc for detecting flaws in all directions regardless of the flaw direction. Four Θ-shaped eddy current testing probes P11 to P22 are arranged around the rotation center Ds1 of a rotating disc 111, and are embedded in the disc 111. The coil planes of detector coils Ds11 to Ds22 of the testing probes P11 to P22 are parallel with each other, and are perpendicular to the rotation plane of the rotating disc 111. The coil planes of the detector coils incline at an angle θ relative to a line Y passing through the centers Ps11 and Ps12 of the probes P11 and P12. The detector coils Dc11 and Dc12 are cumulatively connected to each other, and the detector coils Dc21 and Dc22 are differentially connected to each other.

摘要翻译： 旋转涡流探伤探针装置具有多个Θ形的涡流探伤探针，其安装在旋转盘中，用于检测各个方向的瑕疵，而不管瑕疵方向如何。 四个Θ形涡流测试探针P11至P22围绕旋转盘111的旋转中心Ds1布置，并被嵌入盘111中。测试探针P11至P22的检测器线圈Ds11至Ds22的线圈平面平行 彼此垂直于旋转盘111的旋转平面。检测器线圈的线圈平面以一定角度倾斜; 相对于穿过探针P11和P12的中心Ps11和Ps12的线Y。 检测器线圈Dc11和Dc12彼此累积连接，检测线圈Dc21和Dc22彼此差分连接。

公开(公告)号：US08638091B2

公开(公告)日：2014-01-28

申请号：US13286429

申请日：2011-11-01

申请人： Takashi Hibino ,  Takashi Fujimoto ,  Shigeki Namekata ,  Keisuke Komatsu ,  Yoshiyuki Nakao ,  Makoto Takata ,  Makoto Sakamoto

发明人： Takashi Hibino ,  Takashi Fujimoto ,  Shigeki Namekata ,  Keisuke Komatsu ,  Yoshiyuki Nakao ,  Makoto Takata ,  Makoto Sakamoto

IPC分类号： G01N27/90

CPC分类号： G01N27/902 ,  G01N27/904

摘要： A rotary eddy current flaw detection probe device has a plurality of Θ-shaped eddy current flaw detection probes attached in a rotating disc for detecting flaws in all directions regardless of the flaw direction. Four Θ-shaped eddy current testing probes P11 to P22 are arranged around the rotation center Ds1 of a rotating disc 111 and are embedded in the disc 111. The coil planes of detector coils Ds11 to Ds22 of the testing probes P11 to P22 are parallel with each other, and are perpendicular to the rotation plane of the rotating disc 111. The coil planes of the detector coils incline at an angle θ relative to a line Y passing through the centers Ps11 and Ps12 of the probes P11 and P12. The detector coils Dc11 and Dc12 are cumulatively connected to each other and the detector coils Dc21 and Dc22 are differentially connected to each other.

摘要翻译： 旋转涡流探伤探针装置具有附接在旋转盘中的多个Theta形涡流探伤探针，用于检测各个方向的瑕疵，而不管瑕疵方向如何。 四个Theta形涡电流测试探针P11至P22围绕旋转盘111的旋转中心Ds1布置并嵌入到盘111中。测试探针P11至P22的检测器线圈Ds11至Ds22的线圈平面与 彼此垂直于旋转盘111的旋转平面。检测器线圈的线圈面相对于穿过探针P11和P12的中心Ps11和Ps12的线Y以一定角度倾斜。 检测器线圈Dc11和Dc12彼此累积连接，检测线圈Dc21和Dc22彼此差分地连接。

公开(公告)号：US20120161758A1

公开(公告)日：2012-06-28

申请号：US13140845

申请日：2009-12-14

申请人： Takashi Hibino ,  Takashi Fujimoto ,  Keisuke Komatsu ,  Yoshiyuki Nakao ,  Makoto Takata ,  Makoto Sakamoto

发明人： Takashi Hibino ,  Takashi Fujimoto ,  Keisuke Komatsu ,  Yoshiyuki Nakao ,  Makoto Takata ,  Makoto Sakamoto

IPC分类号： G01R33/12

CPC分类号： G01N27/902 ,  G01N27/82

摘要： In an eddy current testing method which involves using a rotatable eddy current testing probe in which a detection coil is arranged within an exciting coil, a change in detection sensitivity (a deviation of detection sensitivity) which changes depending on the rotational position of the detection coil is reduced. The eddy current testing probe includes an exciting coil EC1, a detection coil DC1, an exciting coil EC2 and a detection coil DC2, which are mounted on a disk DS. The eddy current testing probe is placed so as to face a circumferential surface of an object to be inspected T, which is in the shape of a circular cylinder, and the disk DS is rotated. Then, the distance (liftoff) between the detection coils DC1 and DC2 and an inspection surface changes. Therefore, also the detection sensitivity to a flaw signal changes. To reduce the change in detection sensitivity, the detection sensitivity is adjusted by detecting the rotational position (rotational angle) of the detection coils DC1 and DC2.

摘要翻译： 在涡电流测试方法中，涉及使用其中检测线圈布置在励磁线圈内的可旋转涡流测试探针，检测灵敏度的变化（检测灵敏度的偏差）根据检测线圈的旋转位置而变化 降低了。 涡电流测试探头包括安装在盘DS上的励磁线圈EC1，检测线圈DC1，励磁线圈EC2和检测线圈DC2。 将涡电流测试探针放置成面对被检查物体T的圆周表面，该圆形表面呈圆柱形，圆盘DS旋转。 然后，检测线圈DC1和DC2之间的距离（剥离）和检查面发生变化。 因此，对缺陷信号的检测灵敏度也会发生变化。 为了减小检测灵敏度的变化，通过检测检测线圈DC1和DC2的旋转位置（旋转角度）来调节检测灵敏度。