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    AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe Microscope
    1.
    发明申请
    AFM Tweezers, Method for Producing AFM Tweezers, and Scanning Probe Microscope 有权
    AFM镊子，生产AFM镊子的方法和扫描探针显微镜

    公开(公告)号：US20090000365A1

    公开(公告)日：2009-01-01

    申请号：US12143410

    申请日：2008-06-20

    申请人： Tatsuya KOBAYASHI ,  Masato SUZUKI ,  Masatoshi YASUTAKE ,  Takeshi UMEMOTO

    发明人： Tatsuya KOBAYASHI ,  Masato SUZUKI ,  Masatoshi YASUTAKE ,  Takeshi UMEMOTO

    IPC分类号： G12B21/08

    CPC分类号： G01Q60/38 ,  G01Q80/00 ,  Y10S977/962

    摘要： AFM tweezers includes: a first probe that comprises a triangular prism member having a ridge, a tip of which is usable as a probe tip in a scanning probe microscope; a second probe that comprises a triangular prism member provided so as to open/close with respect to the first probe. The first probe and the second probe are juxtaposed such that a predetermined peripheral surface of the triangular prism member of the first probe and a predetermined peripheral surface of the triangular prism member of the second probe face substantially in parallel to each other, and the first probe formed of a notch that prevents interference with a sample when the sample is scanned by the tip of the ridge.

    摘要翻译： AFM镊子包括：第一探针，其包括具有脊的三角形棱镜构件，其尖端可用作扫描探针显微镜中的探针尖端; 第二探针，包括设置成相对于第一探针打开/关闭的三角形棱镜部件。 第一探针和第二探针并置，使得第一探针的三角形棱镜构件的预定外周表面和第二探针的三角形棱镜构件的预定外周表面基本上彼此平行，并且第一探针 形成为当样品被脊的尖端扫描时防止样品干扰的凹口。