ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION
    4.
    发明申请
    ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION 有权
    线路电路修改的抗结构

    公开(公告)号:US20110079874A1

    公开(公告)日:2011-04-07

    申请号:US12574926

    申请日:2009-10-07

    IPC分类号: H01L23/525 H01L21/768

    摘要: An antifuse structure and methods of forming contacts within the antifuse structure. The antifuse structure includes a substrate having an overlying metal layer, a dielectric layer formed on an upper surface of the metal layer, and a contact formed of contact material within a contact via etched through the dielectric layer into the metal layer. The contact via includes a metal material at a bottom surface of the contact via and an untreated or partially treated metal precursor on top of the metal material.

    摘要翻译: 反熔丝结构和在反熔丝结构内形成接触的方法。 反熔丝结构包括具有上覆金属层的基板,形成在金属层的上表面上的电介质层,以及由通过电介质层蚀刻到金属层中的接触孔内的接触材料形成的接触。 接触通孔在接触通孔的底表面处包括金属材料,并且在金属材料的顶部上包​​括未处理或部分处理的金属前体。

    ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION
    6.
    发明申请
    ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION 有权
    线路电路修改的抗结构

    公开(公告)号:US20120126366A1

    公开(公告)日:2012-05-24

    申请号:US13360270

    申请日:2012-01-27

    IPC分类号: H01L23/525

    摘要: An antifuse structure and methods of forming contacts within the antifuse structure. The antifuse structure includes a substrate having an overlying metal layer, a dielectric layer formed on an upper surface of the metal layer, and a contact formed of contact material within a contact via etched through the dielectric layer into the metal layer. The contact via includes a metal material at a bottom surface of the contact via and an untreated or partially treated metal precursor on top of the metal material.

    摘要翻译: 反熔丝结构和在反熔丝结构内形成接触的方法。 反熔丝结构包括具有上覆金属层的基板,形成在金属层的上表面上的电介质层,以及由通过电介质层蚀刻到金属层中的接触孔内的接触材料形成的接触。 接触通孔在接触通孔的底表面处包括金属材料,并且在金属材料的顶部上包​​括未处理或部分处理的金属前体。

    Antifuse structure for in line circuit modification
    8.
    发明授权
    Antifuse structure for in line circuit modification 有权
    线路电路改造的防腐结构

    公开(公告)号:US08367483B2

    公开(公告)日:2013-02-05

    申请号:US13360203

    申请日:2012-01-27

    IPC分类号: H01L21/82

    摘要: An antifuse structure and methods of forming contacts within the antifuse structure. The antifuse structure includes a substrate having an overlying metal layer, a dielectric layer formed on an upper surface of the metal layer, and a contact formed of contact material within a contact via etched through the dielectric layer into the metal layer. The contact via includes a metal material at a bottom surface of the contact via and an untreated or partially treated metal precursor on top of the metal material.

    摘要翻译: 反熔丝结构和在反熔丝结构内形成接触的方法。 反熔丝结构包括具有上覆金属层的基板,形成在金属层的上表面上的电介质层,以及由通过电介质层蚀刻到金属层中的接触孔内的接触材料形成的接触。 接触通孔在接触通孔的底表面处包括金属材料,并且在金属材料的顶部上包​​括未处理或部分处理的金属前体。

    Antifuse structure for in line circuit modification
    9.
    发明授权
    Antifuse structure for in line circuit modification 有权
    线路电路改造的防腐结构

    公开(公告)号:US08125048B2

    公开(公告)日:2012-02-28

    申请号:US12574926

    申请日:2009-10-07

    IPC分类号: H01L29/00

    摘要: An antifuse structure and methods of forming contacts within the antifuse structure. The antifuse structure includes a substrate having an overlying metal layer, a dielectric layer formed on an upper surface of the metal layer, and a contact formed of contact material within a contact via etched through the dielectric layer into the metal layer. The contact via includes a metal material at a bottom surface of the contact via and an untreated or partially treated metal precursor on top of the metal material.

    摘要翻译: 反熔丝结构和在反熔丝结构内形成接触的方法。 反熔丝结构包括具有上覆金属层的基板,形成在金属层的上表面上的电介质层,以及由通过电介质层蚀刻到金属层中的接触孔内的接触材料形成的接触。 接触通孔在接触通孔的底表面处包括金属材料,并且在金属材料的顶部上包​​括未处理或部分处理的金属前体。