专利检索 ap:("Texas Research International, Inc.") AND inv:"Marcus Keiser" 第 1 页

1.

发明授权
Nondestructive sensing device and method for inspection and measuring the cleanliness of composite surfaces coupled with methods for removing contaminants and activating the composite surfaces 有权

公开(公告)号：US11933749B2

公开(公告)日：2024-03-19

申请号：US17472533

申请日：2021-09-10

申请人： Texas Research International, Inc.

发明人： Doyle T. Motes, III , Marcus Keiser , Richard Piner

IPC分类号： G01N23/22 , G01N23/2202 , G01N23/225

CPC分类号： G01N23/2202 , G01N23/225

摘要： Non-destructive sensing methods and devices for inspection and measuring in manufacturing applications for removal of contaminants from composite surfaces coupled with sensing and activation of the composite surfaces.

2.

发明申请
Nondestructive Sensing Device and Method for Inspection and Measuring the Cleanliness of Composite Surfaces Coupled with Methods for Removing Contaminants and Activating the Composite Surfaces 有权

公开(公告)号：US20220136986A1

公开(公告)日：2022-05-05

申请号：US17472533

申请日：2021-09-10

申请人： Texas Research International, Inc.

发明人： Doyle T. Motes, III , Marcus Keiser , Richard Piner

IPC分类号： G01N23/2202 , G01N23/225

摘要： Non-destructive sensing methods and devices for inspection and measuring in manufacturing applications for removal of contaminants from composite surfaces coupled with sensing and activation of the composite surfaces.