DEFECT CENTRE-BASED SENSOR
    1.
    发明申请

    公开(公告)号:US20220146605A1

    公开(公告)日:2022-05-12

    申请号:US17427127

    申请日:2020-01-29

    Abstract: A defect centre-based sensor is disclosed. The sensor comprises instrumentation which includes a generator for causing excitation in an active element, for example a diamond, and a detector for measuring a transition in the active element. The generator is an optical source and/or the detector is an optical detector. The sensor further comprises an optical waveguide and a sensor head in communication with the source and/or the detector via the optical waveguide. The sensor head houses the active element having at least one defect centre, for example, a nitrogen vacancy, responsive to an applied magnetic field, electric field or temperature and a signal delivery arrangement, for example at least one lens, arranged to optically couple the optical waveguide to the active element.

Patent Agency Ranking