公开(公告)号：US20230125349A1

公开(公告)日：2023-04-27

申请号：US17874201

申请日：2022-07-26

申请人： Tianjin University

发明人： Xin GAO ,  Zhenyu ZHAO ,  Hong LI

IPC分类号： G01K11/20 ,  G01K11/32

摘要： A method for in situ measurement of temperature at microwave-induced microscopic hot spots, temperature measuring particles and the device used are provided. For the temperature measurement demand of the microscopic hot spot of microwave field, loading fluorescent temperature measuring particles on the surface of solid particles, and the actual temperature of particles in micro scale can be measured by using its temperature sensitive fluorescence characteristics. The present disclosure builds a microwave field in-situ fluorescence test device to disperse the test particles loaded with fluorescent temperature measuring materials in the liquid solvent and place in the quartz sample tank in the microwave cavity, which can measure the actual temperature of the particles to be measured under microwave radiation. The present disclosure breaks through the difficult problem of measuring micro scale temperature in microwave field and can realize the quantitative measurement of microwave-induced overheating temperature in micro scale.