公开(公告)号：US11609836B2

公开(公告)日：2023-03-21

申请号：US17180897

申请日：2021-02-22

Applicant: UNITED MICROELECTRONICS CORP.

Inventor： Ching-Pei Lin ,  Ji-Fu Kung ,  Te-Hsuan Chen ,  Yi-Lin Hung

IPC: G06F11/00 ,  G06F11/32 ,  G06F11/30 ,  G06F11/34 ,  G06F18/214 ,  G05B23/02

Abstract: An operation method and an operation device of a failure detection and classification (FDC) model are provided. The operation method of the FDC model includes the following steps. A plurality of raw traces are continuously obtained. If the raw traces have started to be changed from the first waveform to the second waveform, whether at least N pieces in the race traces have been changed to the second waveform is determined. If at least N pieces in the raw traces have been changed to the second waveform, the raw traces which have been changed to the second waveform are automatically segmented to obtain several windows. An algorithm is automatically set for each of the windows. Through each of the algorithms, an indicator of each of the windows is obtained. The FDC model is retrained based on these indicators.