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公开(公告)号:US20240334675A1
公开(公告)日:2024-10-03
申请号:US18616472
申请日:2024-03-26
发明人: Koji SAKUI , Yoshihisa Iwata , Masakazu Kakumu , Nozomu Harada
IPC分类号: H10B12/00 , G11C11/404 , G11C11/4091 , G11C11/4096
CPC分类号: H10B12/20 , G11C11/404 , G11C11/4091 , G11C11/4096
摘要: In a memory device, a page is composed of memory cells arranged in rows, and pages are arranged in columns in plan view on a substrate. Each memory cell has a semiconductor base, a first impurity region and a second impurity region at both ends of the semiconductor base, and at least two gate conductor layers. The first impurity region is connected to a source line, the second impurity region to a bit line, one of the two gate conductor layers to a selection gate line, and the other to a plate line. Voltages applied to these lines are controlled to perform page erasing and writing operations. A hole group formed by impact ionization is retained within the semiconductor base to have three-valued logic storage data. A sense amplifier circuit performs determination in an order of logic storage data with a large number of holes in the hole group.