公开(公告)号：US20230003512A1

公开(公告)日：2023-01-05

申请号：US17841514

申请日：2022-06-15

Applicant: Universität Stuttgart

Inventor： Patrick FOLTYN ,  Bernhard WEIGAND ,  Norbert ROTH

IPC: G01B11/22 ,  G01F15/00

Abstract: The present invention relates to a measuring device (10) and a method for determining a depth of field of an optical structure (100). In this case, the measuring device comprises a device body (12) with a measuring axis (14), the device body (12) being formed such that, in a measuring position, it can be placed in a stationary manner on a deposit plane of the optical structure such that the measuring axis (14) of the device body (12) coincides with an optical axis of the optical structure, wherein the device body (12) has a measurement scale (18) arranged along a scale line (16) such that the scale line (16) encloses with the direction of the measuring axis (14) a scale angle φ greater than 0° and less than 90° and the measurement scale (18) can be optically detected in the measuring position of the device body (12) by the optical structure (100) for determining the depth of field.