公开(公告)号：US11921130B2

公开(公告)日：2024-03-05

申请号：US17146288

申请日：2021-01-11

Applicant: University of Warwick

Inventor： Patrick Unwin ,  Kim Martin McKelvey

IPC: G01Q60/60 ,  B22D19/14 ,  C23C26/02 ,  E21C35/183

CPC classification number: G01Q60/60 ,  B22D19/14 ,  C23C26/02 ,  E21C35/183 ,  E21C35/1831 ,  E21C35/1833 ,  E21C35/1835 ,  Y10T428/12937 ,  Y10T428/12965

Abstract: A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging.

公开(公告)号：US20150059027A1

公开(公告)日：2015-02-26

申请号：US14504357

申请日：2014-10-01

Applicant: University of Warwick

Inventor： Patrick Unwin ,  Kim Martin McKelvey

IPC: G01Q60/60

CPC classification number: G01Q60/60 ,  B22D19/14 ,  C23C26/02 ,  E21C35/183 ,  E21C2035/1806 ,  E21C2035/1809 ,  E21C2035/1813 ,  Y10T428/12937 ,  Y10T428/12965

Abstract: A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging.

Abstract translation: 介绍了一种能够独立解决地形和表面活动的新型扫描电化学显微镜尖端定位方法。 SECM尖端相对于感兴趣的表面振荡。 由SECM尖端与感兴趣的表面的间歇接触引起的振荡幅度的变化用于检测感兴趣的表面，并且用作各种成像的反馈信号。

公开(公告)号：US20160195570A1

公开(公告)日：2016-07-07

申请号：US15069815

申请日：2016-03-14

Applicant: University of Warwick

Inventor： Patrick Unwin ,  Kim Martin McKelvey

IPC: G01Q60/60

CPC classification number: G01Q60/60 ,  B22D19/14 ,  C23C26/02 ,  E21C35/183 ,  E21C2035/1806 ,  E21C2035/1809 ,  E21C2035/1813 ,  Y10T428/12937 ,  Y10T428/12965

Abstract: A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging.

公开(公告)号：US20210373047A1

公开(公告)日：2021-12-02

申请号：US17146288

申请日：2021-01-11

Applicant: University of Warwick

Inventor： Patrick Unwin ,  Kim Martin McKelvey

IPC: G01Q60/60 ,  B22D19/14 ,  C23C26/02 ,  E21C35/183

Abstract: A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging

公开(公告)号：US20180052187A1

公开(公告)日：2018-02-22

申请号：US15473362

申请日：2017-03-29

Applicant: University of Warwick

Inventor： Patrick Unwin ,  Kim Martin McKelvey

IPC: G01Q60/60 ,  E21C35/183 ,  B22D19/14 ,  C23C26/02 ,  E21C35/18

CPC classification number: G01Q60/60 ,  B22D19/14 ,  C23C26/02 ,  E21C35/183 ,  E21C2035/1806 ,  E21C2035/1809 ,  E21C2035/1813 ,  Y10T428/12937 ,  Y10T428/12965

Abstract: A new scanning electrochemical microscopy tip positioning method that allows topography and surface activity to be resolved independently is presented. A SECM tip is oscillated relative to the surface of interest. Changes in the oscillation amplitude, caused by the intermittent contact of the SECM tip with the surface of interest, are used to detect the surface of interest, and as a feedback signal for various types of imaging.