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公开(公告)号:US11555916B2
公开(公告)日:2023-01-17
申请号:US16467819
申请日:2017-12-08
Applicant: University of Washington
Inventor: Matthew S. Reynolds , Andreas Pedross-Engel , Claire Watts , Sandamali Devadithya
Abstract: Examples of imaging systems are described herein which may implement microwave or millimeter wave imaging systems. Examples described may implement partitioned inverse techniques which may construct and invert a measurement matrix to be used to provide multiple estimates of reflectivity values associated with a scene. The processing may be partitioned in accordance with a relative position of the antenna system and/or a particular beamwidth of an antenna. Examples described herein may perform an enhanced resolution mode of imaging which may steer beams at multiple angles for each measurement position.
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公开(公告)号:US20230079634A1
公开(公告)日:2023-03-16
申请号:US17933805
申请日:2022-09-20
Applicant: University of Washington
Inventor: Matthew S. Reynolds , Andreas Pedross-Engel , Claire Watts , Sandamali Devadithya
Abstract: Examples of imaging systems are described herein which may implement microwave or millimeter wave imaging systems. Examples described may implement partitioned inverse techniques which may construct and invert a measurement matrix to be used to provide multiple estimates of reflectivity values associated with a scene. The processing may be partitioned in accordance with a relative position of the antenna system and/or a particular beamwidth of an antenna. Examples described herein may perform an enhanced resolution mode of imaging which may steer beams at multiple angles for each measurement position.
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公开(公告)号:US20210405182A1
公开(公告)日:2021-12-30
申请号:US16467819
申请日:2017-12-08
Applicant: University of Washington
Inventor: Matthew S. Reynolds , Andreas Pedross-Engel , Claire Watts , Sandamali Devadithya
Abstract: Examples of imaging systems are described herein which may implement microwave or millimeter wave imaging systems. Examples described may implement partitioned inverse techniques which may construct and invert a measurement matrix to be used to provide multiple estimates of reflectivity values associated with a scene. The processing may be partitioned in accordance with a relative position of the antenna system and/or a particular beamwidth of an antenna. Examples described herein may perform an enhanced resolution mode of imaging which may steer beams at multiple angles for each measurement position.
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