公开(公告)号：US20220130065A1

公开(公告)日：2022-04-28

申请号：US17509590

申请日：2021-10-25

Applicant: VUNO Inc.

Inventor： Eunpyeong HONG ,  Wonmo JUNG ,  Sejin PARK ,  Hyunwoo OH ,  Dong Soo LEE ,  Weon Jin KIM ,  Jinkyeong SUNG

IPC: G06T7/62 ,  G06T7/00 ,  G06T17/20

Abstract: Disclosed is a method for analyzing a thickness of a cortical region, performed by a computing device. The method may include: extracting a plurality of interfaces included in a cortical region based on a mask generated from a medical image including at least one brain region; and estimating a thickness of the cortical region based on the plurality of interfaces.