AUTOMATIC DEVICE TESTING
    2.
    发明申请

    公开(公告)号:US20190028699A1

    公开(公告)日:2019-01-24

    申请号:US15654220

    申请日:2017-07-19

    Abstract: A device can receive an indication to perform a test of a capability of the device to receive data. The data can have a threshold data rate. The device can perform an action to cause the device to receive the data from a source of the data at the threshold data rate. The device can monitor a set of metrics related to the data or a performance of the device. The device can perform an analysis of the set of metrics after monitoring the set of metrics. The device can identify a source of an error based on a result of performing the analysis of the set of metrics. The source of the error can be related to the data or the performance of the device. The device can perform another action related to fixing the source of the error.

    Automatic device testing
    3.
    发明授权

    公开(公告)号:US10250873B2

    公开(公告)日:2019-04-02

    申请号:US15654220

    申请日:2017-07-19

    Abstract: A device can receive an indication to perform a test of a capability of the device to receive data. The data can have a threshold data rate. The device can perform an action to cause the device to receive the data from a source of the data at the threshold data rate. The device can monitor a set of metrics related to the data or a performance of the device. The device can perform an analysis of the set of metrics after monitoring the set of metrics. The device can identify a source of an error based on a result of performing the analysis of the set of metrics. The source of the error can be related to the data or the performance of the device. The device can perform another action related to fixing the source of the error.

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