公开(公告)号：US06359964B1

公开(公告)日：2002-03-19

申请号：US09447540

申请日：1999-11-23

Applicant: Vladimir A. Kogan

Inventor： Vladimir A. Kogan

IPC: G01N23201

CPC classification number: G01N23/20 ,  G01N23/20016

Abstract: An apparatus for X-ray analysis of materials advantageously utilizes a parabolic multilayer mirror for parallelizing the X-rays. Moreover, it may be desirable to monochromatize the parallelized radiation, for example by means of a crystal monochromator. According to the invention an influencing device for the X-rays is constructed as a single mechanical unit comprising a combination of an X-ray mirror (46) and a monochromator (48). This unit (66) can be arranged in the analysis apparatus in at least two positions (74, 76) in such a manner that the X-rays travel via the X-ray mirror (46) and the monochromator (48) in the first position (74) whereas the X-rays travel only via the X-ray mirror (46) in the second position (76). Consequently, no separate units comprising only an X-ray mirror or a combination of an X-ray mirror and a monochromator are required, so that a substantial saving in costs is achieved.

Abstract translation: 用于材料的X射线分析的装置有利地利用用于平行X射线的抛物面多层反射镜。 此外，例如通过晶体单色仪可能需要对并行辐射进行单色化。 根据本发明，用于X射线的影响装置被构造为包括X射线反射镜（46）和单色仪（48）的组合的单个机械单元。 该单元（66）可以以至少两个位置（74,76）布置在分析设备中，使得X射线经由第一个（X）的X射线反射镜（46）和单色仪（48）行进 位置（74），而X射线仅在第二位置（76）中通过X射线镜（46）行进。 因此，不需要仅包括X射线镜或X射线镜和单色仪的组合的单独单元，从而实现了大量的成本节省。