公开(公告)号：US20230185987A1

公开(公告)日：2023-06-15

申请号：US17551514

申请日：2021-12-15

Applicant: X Development LLC

Inventor： Ardavan Oskooi ,  Martin Schubert ,  Cyril Pierre Bortolato

IPC: G06F30/20

CPC classification number: G06F30/20

Abstract: In some embodiments, a non-transitory computer-readable medium is provided. The computer-readable medium has logic stored thereon that, in response to execution by one or more processors of a computing system, cause the computing system to perform actions for deriving a fabrication model for a fabrication system using an inverse design process. The actions include determining a test design for a test physical device, measuring performance of an instance of the test physical device fabricated by the fabrication system using the test design to determine an as-fabricated performance metric, optimizing the test design using a first loss function based on differences in a simulated performance metric of the test design and the as-fabricated performance metric to determine an as-fabricated design, and optimizing a fabrication model using a second loss function based on differences between the test design and the as-fabricated design.