Methods and devices for aligning and determining the focusing characteristics of x-ray optics
    1.
    发明申请
    Methods and devices for aligning and determining the focusing characteristics of x-ray optics 失效
    用于对准和确定x射线光学元件聚焦特性的方法和装置

    公开(公告)号:US20040151281A1

    公开(公告)日:2004-08-05

    申请号:US10764257

    申请日:2004-01-23

    CPC classification number: G21K1/06 A61N2005/1091

    Abstract: Methods and devices for aligning an x-ray optic with a source of x-rays and methods and devices for determining a focusing characteristic of an x-ray optic are provided. The methods and devices simplify the process of aligning an x-ray optic device (for example, a polycapillary x-ray optic) to an x-ray source or for measuring a focusing characteristic, for example, the focal length or beam shape, of an x-ray optic. In one aspect, the device includes a housing having a first aperture adapted for receiving an x-ray optic and a surface having an x-ray flourescent material from which visual fluorescence occurs when impinged by x-rays. The size and shape of fluorescence from the surface may be varied by moving the surface to determine, for example, the focal length of the x-ray optic.

    Abstract translation: 提供了用于将X射线光学元件与X射线源对准的方法和装置,以及用于确定x射线光学器件的聚焦特性的方法和装置。 这些方法和装置简化了将x射线光学器件(例如,多毛细管X射线光学器件)与X射线源对准或用于测量聚焦特性(例如焦距或光束形状)的过程 一个x射线光学元件。 在一个方面,所述装置包括壳体,该壳体具有适于接收x射线光学元件的第一孔和具有x射线荧光材料的表面,当由X射线照射时,可从该X射线荧光材料发生视觉荧光。 可以通过移动表面来改变来自表面的荧光的尺寸和形状,以确定例如x射线光学元件的焦距。

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