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公开(公告)号：US11465407B2
公开(公告)日：2022-10-11
申请号：US16942042
申请日：2020-07-29
Applicant: Xerox Corporation
Inventor： James P. Calamita , Shawn P. Updegraff , Michael B. Monahan
Abstract: According to aspects of the embodiments, there is provided methods to measure characteristics of line width and density of printed test patterns. By printing the test patterns and capturing with an in-line scanner or optical device, the analytical results of these test patterns can be used as feedback to a control system that adjusts both impression and inking levels without the need of a skilled operator.
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