Method of, and apparatus for, adaptive sampling
    1.
    发明授权
    Method of, and apparatus for, adaptive sampling 有权
    自适应采样的方法和装置

    公开(公告)号:US09306828B2

    公开(公告)日:2016-04-05

    申请号:US13941220

    申请日:2013-07-12

    摘要: A method of sampling sensor data from a computing system is presented. The computing system includes a plurality of components and a sensor network for monitoring the computing system. The sensor network includes primary sensor nodes operable to obtain primary parameter data from a measurement of a primary parameter of the components, and secondary sensor nodes operable to obtain secondary parameter data from a measurement of secondary parameters of the components. The method includes: a) obtaining secondary parameter data from secondary sensor nodes relating to components; b) processing, in a computing device, the secondary parameter data; c) determining, based upon determined or pre-determined relationships between the secondary parameters and the primary parameter, a sample rate for the primary parameter data for the components; and d) obtaining primary parameter data from the primary sensor nodes relating to components at the determined sample rate.

    摘要翻译: 提出了一种从计算系统采样传感器数据的方法。 计算系统包括多个组件和用于监视计算系统的传感器网络。 所述传感器网络包括主要传感器节点,可操作以从所述组件的主要参数的测量获得主要参数数据,以及辅助传感器节点可操作以从所述组件的次要参数的测量获得次要参数数据。 该方法包括:a)从与组件有关的次级传感器节点获得次要参数数据; b)在计算设备中处理次要参数数据; c)基于所述次要参数和所述主要参数之间的确定或预定的关系来确定所述组件的主要参数数据的采样率; 以及d)从所述主要传感器节点获得与所确定的采样率相关的组件的主要参数数据。

    METHOD OF, AND APPARATUS FOR, ADAPTIVE SAMPLING
    2.
    发明申请
    METHOD OF, AND APPARATUS FOR, ADAPTIVE SAMPLING 有权
    用于自适应采样的方法和装置

    公开(公告)号:US20150019917A1

    公开(公告)日:2015-01-15

    申请号:US13941220

    申请日:2013-07-12

    IPC分类号: G06F11/07 G06N5/04

    摘要: A method of sampling sensor data from a computing system is presented. The computing system includes a plurality of components and a sensor network for monitoring the computing system. The sensor network includes primary sensor nodes operable to obtain primary parameter data from a measurement of a primary parameter of the components, and secondary sensor nodes operable to obtain secondary parameter data from a measurement of secondary parameters of the components. The method includes: a) obtaining secondary parameter data from secondary sensor nodes relating to components; b) processing, in a computing device, the secondary parameter data; c) determining, based upon determined or pre-determined relationships between the secondary parameters and the primary parameter, a sample rate for the primary parameter data for the components; and d) obtaining primary parameter data from the primary sensor nodes relating to components at the determined sample rate.

    摘要翻译: 提出了一种从计算系统采样传感器数据的方法。 计算系统包括多个组件和用于监视计算系统的传感器网络。 所述传感器网络包括主要传感器节点,可操作以从所述组件的主要参数的测量获得主要参数数据,以及辅助传感器节点可操作以从所述组件的次要参数的测量获得次要参数数据。 该方法包括:a)从与组件有关的次级传感器节点获得次要参数数据; b)在计算设备中处理次要参数数据; c)基于所述次要参数和所述主要参数之间的确定或预定的关系来确定所述组件的主要参数数据的采样率; 以及d)从所述主要传感器节点获得与所确定的采样率相关的组件的主要参数数据。