摘要:
There is provided a switching mode power supply having multiple outputs, including: a DC/DC converter converting a DC voltage level according to a change in a load and including a primary coil and a secondary coil; a boost unit boosting an output voltage of the DC/DC converter in a first mode and outputting the boosted output voltage to an output terminal; a bypass unit bypassing the output voltage of the DC/DC converter in a second mode, to output the bypassed voltage to the output terminal; and a boosting controller controlling the boost unit according to a voltage detected at a center tab of the secondary coil of the DC/DC converter.
摘要:
A reference voltage generation circuit configured to generate a reference voltage level that is compensated for based on an internal temperature change, where the reference voltage level is adjusted based on a resistance value controlled in response to a control signal.
摘要:
A reference voltage generation circuit includes a current source configured to generate a current by compensating for an internal temperature change, and output the generated current to an output node where a reference voltage is generated, and a resistor unit coupled to the output node and having a resistance value controlled in response to a control signal generated in a test mode.
摘要:
A semiconductor memory device includes: a reference voltage generation unit configured to generate first and second reference voltages, wherein a level of the first reference voltage increases with decreasing internal temperature, and a level of the second reference voltage decreases with decreasing internal temperature; and a level control unit configured to control an internal voltage in response to the first and second reference voltages so as to decrease the absolute value of the internal voltage.
摘要:
An array substrate for an LCD device includes a first TFT including a first semiconductor layer, a first gate electrode, wherein the first gate electrode is directly over the first semiconductor layer; a first protrusion extending from the first gate electrode along an edge of the first semiconductor layer; a second TFT including a second semiconductor layer, a second gate electrode, wherein the second gate electrode is directly over the second semiconductor layer; a second protrusion extending from the second gate electrode along an edge of the second semiconductor layer; a third TFT connected to crossed data and gate lines including a third semiconductor layer, a third gate electrode, wherein the third gate electrode is directly over the third semiconductor layer; a third protrusion extending from the third gate electrode along an edge of the third semiconductor layer; and a pixel electrode.
摘要:
Disclosed herein is a sensor for detecting surface defects of a metal tube, which can solve a problem of a conventional eddy current probe in that it is difficult to detect a crack in the circumferential direction of a metal tube.For this purpose, the present provides a sensor for detecting surface defects of a metal tube, the sensor including a plurality of coils wound at a predetermined inclined angle, wherein the plurality of coils is inserted into the inside of a metal tube and an alternating current is applied to the coils to measure a change in impedance of the coils due to a change in an eddy current generated in the metal tube, thus detecting a surface defect of the metal tube.