Method and system for extracting data from surface array deposited features
    4.
    发明授权
    Method and system for extracting data from surface array deposited features 失效
    从表面阵列沉积特征提取数据的方法和系统

    公开(公告)号:US06768820B1

    公开(公告)日:2004-07-27

    申请号:US09659415

    申请日:2000-09-11

    IPC分类号: G06K936

    摘要: A method for evaluating an orientation of a molecular array having features arranged in a pattern. An image of the molecular array is obtained by scanning the molecular array to determine data signals emanating from discrete positions on a surface of the molecular array. An actual result of a function on pixels of the image which pixels lie in a second pattern, is calculated. This actual result is compared with an expected result which would be obtained if the second pattern had a predetermined orientation on the array. Array orientation can then be evaluated based on the result.

    摘要翻译: 一种用于评估具有以图案排列的特征的分子阵列的取向的方法。 通过扫描分子阵列以确定从分子阵列的表面上的离散位置发出的数据信号来获得分子阵列的图像。 计算像素处于第二图案的图像的像素的函数的实际结果。 将该实际结果与如果第二图案在阵列上具有预定取向将获得的预期结果进行比较。 然后可以基于结果来评估阵列取向。