公开(公告)号：US4176951A

公开(公告)日：1979-12-04

申请号：US835004

申请日：1977-09-20

申请人： Andre J. Robert ,  Claude G. Bourdon ,  Nessim C. Msika ,  Etienne G. Chorlay ,  Jean-Louis Euzenade

发明人： Andre J. Robert ,  Claude G. Bourdon ,  Nessim C. Msika ,  Etienne G. Chorlay ,  Jean-Louis Euzenade

IPC分类号： G01N21/21 ,  G01J4/04 ,  G01L1/24

CPC分类号： G01N21/211

摘要： An ellipsometer for measuring the polarization parameters .alpha. and .lambda. of an elliptically polarized light wave. The light wave passes successively through an orientable quarter-wave plate, a birefringent plate rotatable at a constant speed .omega. and a polarizer and then impinges upon a photodetector. Reference signals having angular frequencies of 2.omega. and 4.omega. are generated, one of these signals being employed to synchronously detect the signal at the output of the photodetector by adjusting the quarter-wave plate until the synchronously detected signal component is zero, the orientation of the quarter-wave plate then corresponding to the polarization parameter .alpha.. The parameter .lambda. is obtained by measuring the phase of the component at the output of the photodetector having an angular frequency of 4.omega..The invention applies in particular to photoelasticimetry.

摘要翻译： 用于测量椭圆偏振光波的偏振参数α和λ的椭圆计。 光波依次通过可定向的四分之一波片，可以恒定速度ω和偏振器旋转的双折射板，然后撞击在光电检测器上。 产生具有2ω和4ω的角频率的参考信号，这些信号中的一个用于通过调整四分之一波片同步地检测在光电检测器的输出处的信号，直到同步检测的信号分量为零， 四分之一波片然后对应于极化参数α。 通过测量具有4ω的角频率的光电检测器的输出处的分量的相位来获得参数λ。 本发明特别适用于光弹性测定。