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公开(公告)号:US6140143A
公开(公告)日:2000-10-31
申请号:US833417
申请日:1992-02-10
CPC分类号: G01L9/0042
摘要: A method of micromachining silicon to form relatively thick boss areas and relatively thin flexure areas. The method includes the provision of a deep diffusion of n-type dopant atoms in the vicinity of the desired thick boss structures on a p-type silicon substrate. A layer having a thickness equal to the desired thickness of a flexure area is epitaxially grown of n-type doped silicon over the previously doped p-type substrate. Finally, the p-type doped silicon is etched away by a suitable etchant leaving relatively thick boss areas joined by relatively thin flexure areas.
摘要翻译: 一种微加工硅以形成较厚的凸起区域和较薄的弯曲区域的方法。 该方法包括在p型硅衬底上在期望的厚凸起结构附近提供n型掺杂剂原子的深扩散。 在预先掺杂的p型衬底上,n型掺杂硅的外延生长具有等于弯曲区域所需厚度的厚度的层。 最后,通过合适的蚀刻剂蚀刻p型掺杂的硅,留下相对较薄的凸起区域,其相对薄的弯曲区域连接。