Abstract:
In described examples, at least one tone is generated (114). An output signal is generated (106) in response to an input signal (104) and the at least one tone. The output signal is modulated (120). The input signal (104) and the at least one tone are represented in the modulated output signal. The at least one tone is outside a bandwidth of the input signal (104) as represented in the modulated output signal. The modulated output signal is amplified (122). The at least one tone in the amplified signal is attenuated (124) after the amplifying.
Abstract:
In described examples, apparatus (130) for light projection includes at least one illumination device (131). A cover prism (135) includes a curved surface (141) positioned to receive illumination light rays (153) and a total internal reflection surface positioned to internally reflect the light rays towards an asymmetric reflector surface (143) positioned opposite the total internal reflection surface. The asymmetric reflector surface (143) is configured to reflect the received light rays out of the cover prism (135) at an emitter side of the cover prism. A spatial light modulator (139) modulates the illumination light rays with image data to form image light rays. A reverse total internal reflection (RTIR) (133) prism is positioned between the spatial light modulator (139) and the emitter side of the cover prism (135). A total internal reflection surface is configured to totally internally reflect the image light rays out of the RTIR prism (133) into a light projection device (145).
Abstract:
In described examples of limiting current in a low dropout ("LDO") linear voltage regulator (300), a pass element (330) generates an output voltage (VOUT) that is less than an input voltage. The pass element (330) may be enabled by an error amplifier (3 10) that compares a feedback signal (VFB) from an output (335) of the pass element (330) with a voltage reference (VREF). Also, the pass element (330) may be enabled by a current limiting circuit (353, 354, 355) that bypasses the error amplifier (3 10) to limit current generated at the output (335) of the pass element (330).
Abstract:
In described examples, a test connector is arranged to communicatively couple a design under test (460) to a test fixture. A programmable logic interface (450) is communicatively coupled to the test connector and is arranged to receive a downloadable test bench (454). The downloadable test bench (454) is arranged to apply test vectors from a first set of test vectors (444) to a first test control bus (458). A multiplexer (462) is arranged to selectively couple one of the first test control bus (458) and a second test control bus (464) to a shared test bus (466) that is coupled to the test connector. The second test control bus (464) is arranged to apply test vectors from a second set of test vectors.
Abstract:
In described examples, a coupling circuit (310) includes a primary winding (312), a first secondary winding (320a) and a second secondary winding (320b). The first secondary winding (320a) and the second secondary winding (320b) are inductively associated with the primary winding (312). The coupling circuit (310) is configured to provide a signal at output terminals (322, 324, 326, 328) of the first secondary winding (320a) and the second secondary winding (320b) in response to an input signal (314, 316) received at the primary winding (312). A first power amplifier circuit (340a) is coupled to output terminals (322, 324) of the first secondary winding (320a), and a second power amplifier circuit (340b) is coupled to output terminals (326, 328) of the second secondary winding (320b). Each power amplifier circuit (340a, 340b) is configured to be enabled or disabled based on a bias voltage (Vbiasl, Vbias2) applied at a corresponding secondary winding (320a, 320b).
Abstract:
An example apparatus includes a first power field-effect transistor (FET) (204) having a first source (306), and a second power FET (206) having a second source (308). The first and second power FETs (204, 206) share a common drain (402). The first and second sources (306, 308) are positioned on a first side of a substrate (406), and the common drain (402) is positioned on a second side of the substrate (406) opposite the first side. The example apparatus includes a current sensing FET positioned between first and second portions of the first source (306). The current sensing FET senses a current passing through the first and second power FETs (204, 206).
Abstract:
An ultrasound detect circuit (210) includes a decimator (314) that decimates a transmit signal to be transmitted through an ultrasonic transducer. The transmit signal is decimated to generate first and second template signals. The decimator (314) uses a different decimation ratio to generate the first template signal than the second template signal. The circuit (210) also includes a first correlator (306) to correlate a signal derived from the ultrasonic transducer with the first template signal, a second correlator (308) to correlate the signal derived from the ultrasonic transducer with the second template signal, and a Doppler shift determination circuit (325) to determine a Doppler frequency shift based on an output from the first correlator (306) and an output from the second correlator (308).
Abstract:
In examples, a device includes: magnetic layers (202, 206, 214, 222) including magnetic ink residue; and metallic layers (203, 204, 210, 212, 218, 220, 226, 228) including metallic ink residue and coupled to the magnetic layers (202, 206, 214, 222). The metallic layers (203, 204, 210, 212, 218, 220, 226, 228) are coupled to each other to form a coil.
Abstract:
A time-to-digital converter circuit (100) includes a logic gate (130) configured to receive a first trigger signal indicative of a first clock signal and a second trigger signal indicative of a second clock signal. The logic gate (130) is configured to generate a logic gate output signal responsive to the earlier of the first or second trigger signals to be a logic high. A synchronization circuit (133) is coupled to the logic gate (130) and is configured to synchronize the logic gate output signal to a third clock to produce a synchronization output signal. A counter circuit (150, 158) counts pulses of the synchronization output signal.