公开(公告)号：WO2011083420A3

公开(公告)日：2011-10-13

申请号：PCT/IB2011050020

申请日：2011-01-04

Applicant: ECOLE POLYTECH ,  VILLIGER MARTIN ,  PACHE CHRISTOPHE ,  LASSER THEO

Inventor： VILLIGER MARTIN ,  PACHE CHRISTOPHE ,  LASSER THEO

IPC: G02B21/12 ,  G01B9/02 ,  G01N21/47

CPC classification number: G02B21/125 ,  G01B9/02002 ,  G01B9/02057 ,  G01B9/02091 ,  G01B2290/50 ,  G01B2290/70 ,  G01J3/453

Abstract: The invention relates to an optical coherence microscopy system for fast, phase resolved imaging by means of optical coherence microscopy with decoupled illumination and detection apertures, producing a dark-field effect with an enhanced optical contrast. The setup uses a light source with an appropriate temporal coherence, an interferometer and an array detector combined with a spectrometer. The dark-field effect is produced by optical filter means in the illumination and detection paths, positioned in conjugated planes of the sample microscope objective. These optical means comprise for example refractive or diffractive elements, amplitude or phase masks, or programmable spatial light modulators. The object is scanned via a scanning unit allowing a point scan of the object.

Abstract translation: 本发明涉及一种光学相干显微术系统，用于借助光学相干显微镜（具有去耦合照明和检测孔径）的快速相位分辨成像，产生具有增强的光学对比度的暗场效应。 该设置使用具有适当时间相干性的光源，干涉仪和与光谱仪组合的阵列检测器。 暗场效应由照明和检测路径中的光学过滤装置产生，位于样品显微镜物镜的共轭平面中。 这些光学装置包括例如折射或衍射元件，振幅或相位掩模，或可编程空间光调制器。 物体通过扫描单元进行扫描，允许对物体进行点扫描。

公开(公告)号：WO2011083420A2

公开(公告)日：2011-07-14

申请号：PCT/IB2011/050020

申请日：2011-01-04

Applicant: ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL) ,  VILLIGER, Martin ,  PACHE, Christophe ,  LASSER, Theo

Inventor： VILLIGER, Martin ,  PACHE, Christophe ,  LASSER, Theo

IPC: G02B21/12

CPC classification number: G02B21/125 ,  G01B9/02002 ,  G01B9/02057 ,  G01B9/02091 ,  G01B2290/50 ,  G01B2290/70 ,  G01J3/453

Abstract: The invention relates to an optical coherence microscopy system for fast, phase resolved imaging by means of optical coherence microscopy with decoupled illumination and detection apertures, producing a dark-field effect with an enhanced optical contrast. The setup uses a light source with an appropriate temporal coherence, an interferometer and an array detector combined with a spectrometer. The dark-field effect is produced by optical filter means in the illumination and detection paths, positioned in conjugated planes of the sample microscope objective. These optical means comprise for example refractive or diffractive elements, amplitude or phase masks, or programmable spatial light modulators. The object is scanned via a scanning unit allowing a point scan of the object.

Abstract translation: 本发明涉及通过具有解耦照明和检测孔径的光学相干显微镜进行快速，相位分辨成像的光学相干显微镜系统，产生具有增强的光学对比度的暗场效应。 该设置使用具有适当的时间相干性的光源，干涉仪和与光谱仪结合的阵列检测器。 暗场效应由位于样品显微镜物镜的共轭平面中的照明和检测路径中的滤光器装置产生。 这些光学装置包括例如折射或衍射元件，幅度或相位掩模或可编程空间光调制器。 通过允许对象的点扫描的扫描单元扫描物体。