公开(公告)号：WO2011155903A1

公开(公告)日：2011-12-15

申请号：PCT/SG2011/000209

申请日：2011-06-13

Applicant: AGENCY FOR SCIENCE, TECHNOLOGY AND RESEARCH ,  AN, Chengwu ,  YE, Kaidong ,  XIE, Qiong ,  SONG, Wendong ,  TIAW, Kay Siang

Inventor： AN, Chengwu ,  YE, Kaidong ,  XIE, Qiong ,  SONG, Wendong ,  TIAW, Kay Siang

IPC: G01R33/032 ,  G01J4/04 ,  G01R33/12

CPC classification number: G01N21/01 ,  G01N21/63 ,  G01R33/0325

Abstract: An apparatus and method of testing a magnetic medium at temperatures of interest is disclosed. Properties of the magnetic medium are determined by focusing light from a source of polarized light on a magnetic surface of the magnetic medium; measuring polarization of resulting reflected light due to the magneto-optical Kerr effect, using, for example a measuring subsystem; and varying the light source to heat the magnetic material where incident to pre-defined temperatures, thereby allowing determination of the magnetic properties using the magneto-optical Kerr effect at said pre-defined temperatures.

Abstract translation: 公开了在感兴趣的温度下测试磁性介质的装置和方法。 通过将来自偏振光源的光聚焦在磁性介质的磁性表面上来确定磁性介质的性质; 使用例如测量子系统测量由于磁光克尔效应引起的所产生的反射光的偏振; 并且改变光源以加热入射到预定温度的磁性材料，由此允许使用在所述预定温度下的磁光克尔效应来确定磁特性。