公开(公告)号：WO0033059A3

公开(公告)日：2000-11-23

申请号：PCT/US9928035

申请日：1999-11-24

Applicant: AMERICAN SCIENCE & ENG INC

Inventor： GRODZINS LEE ,  ADAMS WILLIAM L

IPC: G01N23/20 ,  G01N23/203 ,  G01V5/00

CPC classification number: G01N23/20

Abstract: A system and a method for determining the density of an object. The intensity of x-rays backscattered from the object is measured by at least two backscatter detectors disposed at different distances from the intersection of an incident x-ray beam with the plane of the detectors. At least one of detectors is sensitive only to x-rays that have scattered more than once in the object, the ratio of scattered x-rays measured by the detectors being a function of the density of the scattering medium.

Abstract translation: 一种确定物体密度的系统和方法。 从物体反向散射的X射线的强度由至少两个后向散射检测器测量，该至少两个后向散射检测器设置在距入射X射线束与检测器平面相交的不同距离处。 至少一个探测器仅对在物体中散射一次以上的X射线敏感，探测器测量的散射X射线的比例是散射介质密度的函数。

公开(公告)号：WO9913323A3

公开(公告)日：1999-08-26

申请号：PCT/US9818642

申请日：1998-09-08

Applicant: AMERICAN SCIENCE & ENG INC

Inventor： GRODZINS LEE ,  ADAMS WILLIAM L

IPC: G01N23/04 ,  G01V5/00 ,  G01N23/20 ,  G01N23/203

CPC classification number: G01N23/04 ,  G01N23/046 ,  G01N2223/419 ,  G01V5/0016 ,  G01V5/0025 ,  G01V5/005 ,  G01V5/0058

Abstract: A tomography system for analyzing an object concealed within an enveloping surface. The system has multiple beams of penetrating radiation, each beam disposed with a distinct orientation with respect to the enveloping surface. Detectors are provided for measuring radiation backscattered by the contents of the enveloping surface and for measuring radiation transmitted through the enveloping surface. The enveloping surface is moved with respect to the multiple beams, and a timer provides for measurement of a time difference between the appearance of features in signals of respective detectors, allowing geometrical characteristics of the features to be determined and displayed.

Abstract translation: 用于分析隐藏在包络表面内的物体的断层摄影系统。 该系统具有多个穿透辐射束，每个光束相对于包络表面具有不同的取向。 提供检测器用于测量由包络表面的内容物反向散射的辐射，并用于测量透过包络表面的辐射。 包围表面相对于多个波束移动，并且定时器提供测量各个检测器的信号中的特征的出现之间的时间差，允许确定和显示特征的几何特征。