SEMICONDUCTOR CHARGED PARTICLE DETECTOR FOR MICROSCOPY

    公开(公告)号:WO2022106161A1

    公开(公告)日:2022-05-27

    申请号:PCT/EP2021/079725

    申请日:2021-10-26

    Abstract: A detector may be provided for a charged particle apparatus comprising: a sensing element including a diode; and a circuit configured to detect an electron event caused by an electron impacting the sensing element, wherein the circuit comprises a voltage monitoring device and a reset device, wherein the reset device is configured to regularly reset the diode by setting a voltage across the diode to a predetermined value, and wherein the voltage monitoring device is connected to the diode to monitor a voltage across the diode in between resets.

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