公开(公告)号：WO2020003144A2

公开(公告)日：2020-01-02

申请号：PCT/IB2019/055377

申请日：2019-06-26

Applicant: BAR ILAN UNIVERSITY

Inventor： SHIFMAN, Yizhak ,  MILLER, Avi ,  SHOR, Joseph

IPC: H04L9/08

Abstract: A method for detecting unreliable bits in transistor circuitry includes adjusting a value of a variable capacitor coupled to a physical unclonable function (PUF) cell of a transistor circuit. The adjusting includes tilting the PUF cell to either a zero or one state: if the PUF cell changes its state during the tilting it is deemed unstable, and if the PUF cell does not change its state during the tilting it is deemed stable.

公开(公告)号：WO2020003144A3

公开(公告)日：2020-01-02

申请号：PCT/IB2019/055377

申请日：2019-06-26

Applicant: BAR ILAN UNIVERSITY

Inventor： SHIFMAN, Yizhak ,  MILLER, Avi ,  SHOR, Joseph

IPC: H04L9/08

Abstract: A method for detecting unreliable bits in transistor circuitry includes adjusting a value of a variable capacitor coupled to a physical unclonable function (PUF) cell of a transistor circuit. The adjusting includes tilting the PUF cell to either a zero or one state: if the PUF cell changes its state during the tilting it is deemed unstable, and if the PUF cell does not change its state during the tilting it is deemed stable.